Features
- High-quality D/A conversion, 16-Bit/channel
- Continuous background BIT
- External trigger/synchronization
- Automatic shutdown protection with the r2wesults displayed in a status word
- Extended D/A FIFO buffering capabilities
Built-In Test (BIT)/Diagnostic Capability
Two different tests, one online (D2) and one offline (D3), may be selected:
The online (D2) test initiates automatic background BIT testing, where each channel is checked to a test accuracy of 0.2% FS and monitored for shorted output. Any failure triggers an Interrupt (if enabled) with the results available in status registers. The testing is totally transparent to the user, requires no external programming, has no effect on the operation of this card and can be enabled or disabled via the bus.
The offline (D3) test uses an internal A/D that measures all D/A channels while they remain connected to the I/O and cycle through a number of signal levels. Each channel will be checked to a test accuracy of 0.2% FS. Test cycle is completed within 45 seconds and results can be read from the Status registers when D3 changes from 1 to 0. The test can be stopped at any time. This test requires no user programming and can be enabled or disabled via the bus.
Platforms Supported
3U VPX (3 Modules) 6U VPX (6 Modules) 3U cPCI (3 Modules)
6U cPCI (6 Modules) VME (6 Modules) PCIe (3 Modules)