Features
- 24 channels available as inputs or outputs
- Programmable debounce circuitry with selectable time delay eliminates false signals resulting from relay contact bounce
- Built-in test runs in background constantly monitoring system health for each channel
Automatic Background Built-In Test (BIT)/Diagnostic Capability
These modules contain automatic background BIT testing that verifies channel processing (data read or write logic), tests for overcurrent conditions and provides status for threshold signal transitioning. Any failure triggers an Interrupt (if enabled) with the results available in status registers. The testing is totally transparent to the user, requires no external programming and has no effect on the operation of this card. It continually checks that each channel is functional. This capability is accomplished by an additional test comparator that is incorporated into each module. The test comparator checks each channel and is compared against the operational channel. Depending upon the configuration, the Input data read or Output logic written of the operational channel and test comparator must agree or a fault is indicated with the results available in the associated status register. Low-to-High and High-to-Low logic transitions are indicated.
Platforms Supported
3U VPX (3 Modules) 6U VPX (6 Modules) 3U cPCI (3 Modules)
6U cPCI (6 Modules) VME (6 Modules) PCIe (3 Modules)