Thermocouple and RDT Measurement

NAI's thermal measurement smart function modules provide a thermocouple (TC) and/or resistance temperature detector (RTD)

Built-In-Test (BIT) / Diagnostic Capability

Automatic background BIT testing is provided. Each channel is checked for correct A/D operation using an onboard 100 Ω nominal resistor. The open input detection test applies a 0.5 µA current to the A/D converter inputs. The FPGA then tests for a full-scale reading, indicating an open circuit. Any failure triggers an interrupt, if enabled, with the results available in the status registers. The testing is totally transparent to the user and has no effect on the operation of this module. It can be enabled or disabled. It is enabled by default

Platforms Supported

3U VPX  (3 Modules)   6U VPX  (6 Modules)   3U cPCI (3 Modules)     

6U cPCI (6 Modules)     VME (6 Modules)     PCIe (3 Modules)